Test & Diagnosis Of Analogue, Mixed Signal & Rf Integrated Circuits: The System On Chip Approach (Pb)
Test & Diagnosis Of Analogue, Mixed Signal & Rf Integrated Circuits: The System On Chip Approach (Pb)
Author: | Sun Y. |
Publisher: | Iet |
Publishing Year: | 2012 |
ISBN: | 9780863417450 |
Binding: | Paperback |
Item Weight: | 0.50 KG |
Dimensions: | 20 x 18 x 2 cm |
- SKU: 9780863417450_CBS
- Sold by CBS Books
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- Availability: In Stock